Semiconductor analytics platform yieldWerx will unveil yieldWerxIQ™ at ECOC 2026 in Malaga, Spain. This AI-centric platform is designed to directly address the complex manufacturing challenges in photonic integrated circuits and high-speed data center hardware.
Attendees at Booth IF6 will see live demonstrations of powerful capabilities such as DefectIQ™, an advanced module within yieldWerxIQ that isolates killer defect spatial patterns and accelerates root-cause analysis exponentially faster across complex optical-electrical test data. By bridging critical data gaps earlier in production, the solution aims to optimize known-good-die yield for next-generation 1.6T networking architectures.

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