DefectIQ™, the newest defect intelligence capability from yieldWerx, transforms raw KLARF inspection data into yield precision. It ingests defect data at scale and fuses it with electrical test data (bin, parametric, and sort results) on a single wafer map, so engineers can immediately pinpoint which defects actually kill die. Real review images (ADR/SEM) load instantly in an interactive gallery and carry through adder analysis across carry-over chains. Its built-in pattern recognition flags systematic signatures (including edge rings, clusters, scratches, and repeaters) before they impact yield. With full genealogy linking defects and images from fab to final test, DefectIQ can deliver defect-to-yield clarity in minutes.

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