Yelo’s Y4000 Accelerated Ageing System
Stand B103
14th August 2024
The Y4000 Burn-In and Life-Test system was construed as a highly-configurable architecture to facilitate the ever-evolving Accelerated Ageing needs of the photonics market, driven by higher power, higher density test, and optical stressing at low temperatures. Today the Y4000 architecture has seen solutions provided to customers requiring up to 4 Amps channel drive current and to customers with higher channel density requirements, up to 5,120 channel capacity. The Y4000 is ideal for use in R&D centers, reliability test labs, and production environments and represents a x4 increase in density over Yelo’s workhorse system, the Y1000.
https://yelo.co.uk/index.php/products/laser-diode-testing/laser-diode-burn-in/y4000-low-power-laser-diode-burn-in-system

