With the new UFO Probe® Vertical, Jenoptik is expanding its portfolio of probe cards for testing Photonic Integrated Circuits (PICs) at wafer level. It is based on the innovative and patented UFO Probe® technology, which combines a position-insensitive optical concept with proven needle technology in just one test device.
The new UFO Probe® Vertical supports the trend towards smaller chips with significantly more and thus smaller and more densely packed electrical contacts, especially in co-packaged optics. It ensures economical use in high-volume test scenarios and ATE capability.

https://www.jenoptik.com/products/optical-test-measurement-solutions/ufo-probe-card