The Luna 6415 utilizes optical frequency domain reflectometry (OFDR) technology to measure backscattered or transmitted light as a function of distance. Extremely high sensitivity and sampling resolution (20 μm) make the Luna 6415 an ideal testing tool for photonic integrated circuits (PICs) and silicon photonics. The Luna 6415 reduces the cost and complexity of test while increasing throughput by measuring RL, IL and length in reflection or transmission with a single instrument. Luna has solutions tailored for design validation and optimization, and the high-throughput demands of production test.

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