Designed for high-resolution analysis of integrated photonic structures, it enables detailed characterization of DBR cavities for laser applications, with a spatial resolution down to 2.5 µm in SiPh platforms.

The system provides spatially resolved information on reflectors, interfaces, losses, discontinuities, and parasitic reflections along the device. By spatially selecting the DBR section, its reflection spectrum can also be analyzed to determine the Bragg reflection wavelength.

Combining spatial and spectral information in a single measurement, ZEPREN’s OFDR supports design validation, fabrication monitoring, and performance optimization, accelerating the development and fine-tuning of advanced integrated photonic lasers and devices.

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