Yokogawa’s AQ7420 Series High-Resolution Reflectometer sets a new benchmark in optical measurement. With spurious-free waveforms, ultra-high sensitivity down to –100 dB, and dual-wavelength testing in just 10 seconds, it delivers unmatched precision and efficiency. Ideal for both R&D and production, the AQ7420 supports multi-fiber inspection and long-distance fault analysis. Its compact design and automated batch testing streamline workflows, making it the ultimate solution for next-generation optical device evaluation.

AQ7420 High-Resolution Reflectometer | Yokogawa Test&Measurement Corporation