The new N4378A Lightwave Component Analyzer is designed with a strong focus on AI data centers and advanced photonic integrated circuits. It delivers fully calibrated optoelectronic S‑parameter measurements up to 220 GHz, addressing next‑generation optical test challenges. The system supports single‑sweep EO/OE measurements from 100 MHz to 170 GHz or 220 GHz and broad wavelength coverage using onboard and optional lasers, enabling efficient validation of high‑speed optical transmitter and receiver designs, including PIC wafer‑ and die‑level testing.

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