Introducing unique swift multi-die characterization at ECOC

Stand D49

12th June 2024

Unlock the future of integrated photonics with the new OPAL-MD! This state-of-the-art test station offers unparalleled accuracy, repeatability and speed for characterizing multiple dies. Its PILOT software fully automates tasks, turning precise measurements into actionable insights. The complete testing suite supports your entire workflow, making you more data-driven. Paired with EXFO’s renowned optical capabilities and third-party compatibility, the OPAL-MD is your ultimate platform for PIC testing. Join us at ECOC 2024 to see the OPAL-MD in action during a live demo!

Further Information