When characterizing photonic integrated circuits with broadband surface probes, which is typically used for wafer level testing, the coupling loss is of major concern for the achievable dynamic range and measurement uncertainty. An upcoming extra-high-power option for Keysight’s N777-C tunable laser family helps to achieve relevant signal levels in such use cases. Two-way sweeps up to 200 nm/s speed with sub-picometer repeatability make tests faster, more reliable, and lower overall costs. N777-C lasers also offer accuracy with precise wavelengths, real-time tracking, stability over time, and self-adjustment ability.

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